Archive  2010 2009 2008 2007 2006 2005 2004 2003 2002 2001 2000Newsletters Spring '08 Winter '07 Summer '07 Spring '07 New Year '07 Winter '06Click here to sign up and receive eNews newsletters by email |
 |
News & Press Releases - [Main Index] MF6900A Fading Simulator with MIMO functions 2009-02-16 Anritsu Corporation is releasing its MF6900A Fading Simulator with MIMO functions as a part of the 3GPP LTE test solution portfolio. This solution will provide leading edge capability to designers of LTE terminals to help verify MIMO implementations, and to ensure the high data rate capabilities of 3GPP LTE are correctly realized in commercial devices.MIMO is a key LTE technology for enabling high-speed wireless communications. It uses space multiplexing to transmit and receive over multiple antennas; transmission speeds can be increase in proportion to the number of antennas used. When implementing MIMO into LTE terminals, the technology issues faced by terminal and chipset vendors require testing of throughput in a real radio-propagation environment that includes fading and multi-paths. As a result, vendors need to emulate a fading environment to perform non-RF protocol and performance tests. When combined with the MD8430A LTE Base Station Simulator, the MF6900A uses full digital processing to meet this need by outputting an LTE multi-path fading profile that faithfully emulates 2x2MIMO, SISO, SIMO and MISO environments. In addition, close integration between the MF6900A and MD8430A offers a user-friendly set-up even for operators with no experience of complex fading test environments. The MF6900A is also designed to support WCDMA for both MIMO and inter-system handover tests, which is planned as a future software release. With this new LTE test solution, Anritsu is helping assure early rollout of high-quality LTE services.
About Anritsu
For more information contact |
